Thermal Shock Test Chamber (two-box type)

The thermal shock testing chamber is an essential piece of equipment utilized across various industries such as aviation, automotive, home appliances, and scientific research. This chamber is designed to evaluate the performance and reliability of electrical, electronic, automotive electrical components, and materials when subjected to rapid temperature fluctuations between high and low temperature environments. It helps in determining the resilience and operational parameters of these products under extreme temperature conditions. This testing chamber is not only beneficial for educational institutions but also for manufacturing facilities, defense industries, and research organizations. It provides a controlled environment to simulate the effects of thermal shocks, ensuring that the products can withstand the harsh conditions they may encounter in real-world applications.

1. Sleek Design and User-Friendly Operation: The chamber boasts a modern look and straightforward controls, making it a breeze to use.

2. Advanced Temperature Control: Equipped with a high-capacity, imported LCD English microcomputer, it can store up to 100 programs with a maximum of 9999 cycles. Each cycle can be set for up to 999 hours.

3. Dual-Chamber Automation: Featuring separate high and low temperature chambers, the system operates automatically with adjustable dwell and transition times.

4. Comprehensive Safety Features: The chamber includes alarm functions for various potential issues such as short circuits, leaks, and excessive temperatures. It also safeguards against compressor overpressure, overload, and water shortages.

5. Alarm Interface and Emergency Measures: In case of an alarm, the control panel clearly displays the reason and offers troubleshooting steps. An emergency stop button is also provided for immediate safety actions.

6. Rapid Temperature Transition: The chamber achieves cold and hot shock temperature recovery in just one minute, adhering to international standards like MTL, IEC, JIS, and GJB.